Title:
Analysis of mode coupling due to spherical defects in ideal fully metal-coated scanning near-field optical microscopy probes
Author(s):
Wataru Nakagawa, Luciana Vaccaro, and Hans Peter Herzig
Source:
Journal of the Optical Society of America A
Vol./Issue/Date:
Vol. 23, No. 5/May 2006
Year:
2006
Page(s):
1096-1105
Keywords:
Abstract:
We investigate the effect of defects in the metal-coating layer of a scanning near-field optical microscopy
(SNOM) probe on the coupling of polarization modes using rigorous electromagnetic modeling tools. Because of
practical limitations, we study an ensemble of simple defects to identify important trends and then extrapolate
these results to more realistic structures. We find that a probe with many random defects will produce a small
but significant coupling of energy between a linearly polarized input mode and a radial/longitudinal polarization
mode, which is known to produce a strongly localized emitted optical field and is desirable for SNOM
applications. © 2006 Optical Society of America
Document:
Reference Id:
326
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