Title:
Application of Probes with Multiple Outputs on Probe-Compensated EMC Near-Field Measurements
Author(s):
Matthias Spang, Tina Stoeckel, Goeran Schubert, Manfred Albach
Source:
ICIT
Vol./Issue/Date:
Year:
2010
Page(s):
Keywords:
Near-field scan; EMC; Plane wave theory; Probe calibration; Probe compensation
Abstract:
Near-field scanning has become a popular measurement technique in the field of electromagnetic compatibility. This paper presents the application of probe compensation techniques to near-field measurements using probes with multiple outputs. The technique, which is based on plane wave theory, enables the calculation of the electric and magnetic field components above a device under test. Results based on measurements are shown for the case of a short electric dipole probe with two outputs
Document:
Reference Id:
543
Back to References
Please note that this is a collection of external publications.
CST respects the copyrights of the respective owners and as such can not distribute said publications.
Details of copyright ownership is provided to the best of our knowledge. Please contact the given references for further information.