CST – Computer Simulation Technology

Application of Probes with Multiple Outputs on Probe-Compensated EMC Near-Field Measurements
Matthias Spang, Tina Stoeckel, Goeran Schubert, Manfred Albach
IEEE International Conference on Industrial Technology (ICIT), 2010
March 2010
188 - 193
Near-field scan, EMC, Plane wave theory, Probe calibration, Probe compensation
Near-field scanning has become a popular measurement technique in the field of electromagnetic compatibility. This paper presents the application of probe compensation techniques to near-field measurements using probes with multiple outputs. The technique, which is based on plane wave theory, enables the calculation of the electric and magnetic field components above a device under test. Results based on measurements are shown for the case of a short electric dipole probe with two outputs

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