Multi-port admittance model for quantifying the scattering response of loaded plasmonic nanorod antennas
Anastasios H. Panaretos, Douglas H. Werner
Vol. 23, No. 4, 12 Feb 2015
pp 4459 - 4471
In this paper we demonstrate the feasibility of using multiport network theory to describe the admittance properties of a longitudinally loaded plasmonic nanorod antenna. Our analysis reveals that if the appropriate terminal ports are defined across the nanorod geometry then the corresponding voltage and current quantities can be probed and thus it becomes feasible to extract the admittance matrix of the structure. Furthermore, it is demonstrated that by utilizing cylindrical dielectric waveguide theory, closed form expressions can be derived that uniquely characterize the loading material in terms of its admittance. The combination of the admittance matrix information along with the load admittance expressions provides an effective methodology for computing the nanorod's input admittance/impedance for arbitrary loading scenarios. This is important because the admittance resonances are associated with the structure's scattering peaks which are excited by a plane wave polarized parallel to its long dimension. Subsequently, the proposed approach provides a fast and computationally efficient circuit-based methodology to predict and custom engineer the scattering properties of a loaded plasmonic nanorod without having to rely on repetitive lengthy full wave simulations.
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