Subwavelength imaging at optical frequencies using a transmission device formed by a periodic layered metal-dielectric structure operating in the canalization regime
Pavel A. Belov, Yang Hao
PHYSICAL REVIEW B
Volume 73, Issue: 11, 17 March 2006
Imaging with subwavelength resolution using a periodic metal-dielectric layered structure is demonstrated. The structure operates in canalization regime as a transmission device and it does not involve negative refraction and amplification of evanescent modes. The thickness of the structure has to be an integer number of
half-wavelengths and can be made as large as required for ceratin applications, in contrast to the solid metallic slabs operating with subwavelength resolution which have to be much thinner than the wavelength. Resolution of /20 at 600 nm wavelength is confirmed by numerical simulation for a 300 nm thick structure formed by a
periodic stack of 10 nm layers of glass with =2 and 5 nm layers of metal-dielectric composite with =-1. Resolution of /60 is predicted for a structure with same thickness, period and operating frequency, but formed by 7.76 nm layers of silicon with =15 and 7.24 nm layers of silver with =-14.
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