28 Sep 2009

CST announces the introduction of an efficient algorithm in CST MICROWAVE STUDIO® (CST MWS) that enables sensitivity analysis for several parameters in a single simulation run.

Optimization is a typical component of any design engineer’s workflow. With the introduction of new global (genetic, particle swarm) and local (Nelder-Mead) optimizers, CST addressed this issue with release 2009 of CST STUDIO SUITE™. With version 2010 CST goes one step further. CST MWS 2010 features a sensitivity analysis algorithm which is capable of evaluating the s-parameter dependencies on various model parameters after a single 3D electromagnetic simulation run. This means that all further evaluations for different model parameter sets can be derived without restarting the full-wave simulation.
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