CST – Computer Simulation Technology
CST STUDIO SUITE - VNA Measurement Training
This training will cover VNA measurement for the experimental verification of simulation results from CST STUDIO SUITE®.
The course will focus on a practical application of VNA calibration techniques for on-board and coaxial line measurement of S-parameters. The training course consists of 2 full days including theoretical and hands-on parts. The measured data will be consequently used for an extraction of substrate complex permittivity and evaluation of hybrid model of SMD component. The challenges of the proper comparison between the simulation and measurement results will be discussed.
Prazska 636
25241 Dolni Brezany, Czech Republic
9:00 a.m. - 5:00 p.m. (both days)
From: November 14, 2018
Till: November 15, 2018
Fee:1000€
Registration is open.
This will cover the following topics
- Scalar and Vector Measurement
- Random and Systematic Errors
- VNA Architecture and Channel Setup Parameters (Npts, RBW, Pwr)
- 1-Port Calibration Techniques (OSM, SSS, SOS)
- 2(N)-Port Calibration Techniques (TOSM, UOSM, TRL, NIST mTRL)
- Verification of the Calibration
- Calkit Design
- Extraction of Substrate Complex Permittivity using Automatic Macro
- Extraction of Hybrid SMD Model
- Comparison between Simulation and Measurement
This training will be held in English/Czech.
This course is available exclusively to CST customers. Lunch and refreshments will be included. There is a registration deadline one week prior to the training class and subject to availability.
Training equipment
Training material and hardware will be provided on site.
Invoicing
Please note that an invoice will be sent after the training was held.
Cancellation Policy
Cancellations must be made in writing or via your MyCST account. Cancellation of an accepted registration may be made up to seven days before the training without fee. Delegates who request a cancellation after seven days before the training and delegates who do not attend, are responsible for the full attendance fee.
