March 22, 2018
17:00 CET (UTC +1:00)
Simulation plays an increasingly important role in evaluating system performance when subjected to Electromagnetic Environmental Effects (E3) and for investigating strategies for protection. Lightning strike simulation is one of the key applications in this area, which can seem daunting given the multi-scale and multi-physics nature of this fascinating phenomenon. Modeling of complex composite materials and susceptible features such as seams and cables are crucial details to consider.
In this eSeminar, we will show how EM field simulation can provide insightful information with respect to lightning attachment/zoning analysis as well as transient current and magnetic field immunity of relatively large platforms such as aircraft. We will demonstrate definition of the source excitation and boundary conditions, modeling of the lightning channel entry and exit points, and other fundamental aspects of the model setup. Compact models (see our eSeminar on applications of Compact Models) for modeling thin materials, wire meshes and seams, as well as field-cable co-simulation will also be discussed.
Patrick DeRoy is a senior application engineer and market development manager for EMC. DeRoy provides technical support and engineering services to customers, collects their feedback and drives growth efforts and further development of CST’s EMC simulation solutions. DeRoy began work as an application engineer with CST of America in 2012. He received his B.S. and M.S. degrees in electrical and computer engineering from UMass Amherst in 2012, investigating cable modeling and specifically shield transfer impedance modeling, correlating simulation and measurement results. DeRoy’s interests range from emissions and immunity of electronics at the component and subsystem level to RF interference and platform level electromagnetic environmental effects.