Simple models based on the equivalent circuits may fail because of interaction between the SMD body and the layout in which the SMD is placed. In principle such an interaction can not be omitted and therefore the SMD models usually provided by vendors are valid just in the layout where the model was extracted from. Any change of the footprint, substrate thickness or permittivity might cause that the model become to be invalid. Electromagnetic field simulation can be successfully used for correction of such effects, providing enhanced accuracy of the SMD models.
This eSeminar will present a technique for an extraction of the SMD models from measured S-parameters in a given test-fixture using CST Studio Suite®. The concept will be demonstrated using the example of a SMD low-pass filter.