The usual aim of electromagnetic simulation in design is to lower the number of prototypes to reduce costs and time to market. However, this is only possible when the EM simulator is given the correct input data that accurately represents the physical device. Then an excellent agreement between simulation and measurement can be expected. There are many possible causes of discrepancies between the two, including geometric differences (over-etching, over-milling, rounded corners), material properties (anisotropic dielectrics, surface roughness), installed performance (surrounding structures) and feed discrepancies (connector modeling).
This webinar will explore the relationship between simulation, using CST STUDIO SUITE®, and measurement, and explain what each domain is best suited for. In some situations measurement can be difficult to perform while simulation is simpler, and vice versa. Simulation allows many variations on a design to be investigated, using techniques such as parameter sweeps, sensitivity and yield analysis.